通過條件
成 績 :70 分
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224: Introduction to IC Test
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303: Logic Model and Logic Simulation
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310: Fault Models and Fault Simulations
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317: Single-Stuck-Fault Test-Pattern Generation
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324: Design for Testability
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331: Practice on ATPG (Synopsys DfT Compiler/TetraMAX ATPG), Scan Chain
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407: Project Announcement (S3C: Practice on VLSI Testing using Synopsys's 3 Compilers), Continued Practice
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414: Practice on Cell-based Design/Test Flow
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414: Boundary Scan and PracticeScan Based Design, Built-In Self-Test
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421: Sequential Circuit Testing, Test Compaction
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428: 期中考
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505: Memory Test, IDDQ Testing, 4-Way Bridge Test
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512: DfR: Error Control Codes, EDC/ECC, Reliability Test, Confidence Test, BLER/BER/SNR Analyses
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519: Mixed-Signal Test, Ring Oscillator, Signal Integrity Test
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526: SoC Testing & FPGA Test
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602: Low-Power Test
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609: Delay Test
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616: Practical Exam for Cell-based Scan Test
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623: 期末考
- 課程介紹
- 課程安排
- 評論