1102-積體電路測試方法-53028

報名期間：從 即日起 到 無限期
上課期間：從 2022-02-01 到 2022-07-01
學分數：3

• 224: Introduction to IC Test
• 303: Logic Model and Logic Simulation
• 310: Fault Models and Fault Simulations
• 317: Single-Stuck-Fault Test-Pattern Generation
• 324: Design for Testability
• 331: Practice on ATPG (Synopsys DfT Compiler/TetraMAX ATPG), Scan Chain
• 407: Project Announcement (S3C: Practice on VLSI Testing using Synopsys's 3 Compilers), Continued Practice
• 414: Practice on Cell-based Design/Test Flow
• 414: Boundary Scan and PracticeScan Based Design, Built-In Self-Test
• 421: Sequential Circuit Testing, Test Compaction
• 428: 期中考
• 505: Memory Test, IDDQ Testing, 4-Way Bridge Test
• 512: DfR: Error Control Codes, EDC/ECC, Reliability Test, Confidence Test, BLER/BER/SNR Analyses
• 519: Mixed-Signal Test, Ring Oscillator, Signal Integrity Test
• 526: SoC Testing & FPGA Test
• 602: Low-Power Test
• 609: Delay Test
• 616: Practical Exam for Cell-based Scan Test
• 623: 期末考