通過條件成 績 ：70 分
-
224: Introduction to IC Test
-
303: Logic Model and Logic Simulation
-
310: Fault Models and Fault Simulations
-
317: Single-Stuck-Fault Test-Pattern Generation
-
324: Design for Testability
-
331: Practice on ATPG (Synopsys DfT Compiler/TetraMAX ATPG), Scan Chain
-
407: Project Announcement (S3C: Practice on VLSI Testing using Synopsys's 3 Compilers), Continued Practice
-
414: Practice on Cell-based Design/Test Flow
-
414: Boundary Scan and PracticeScan Based Design, Built-In Self-Test
-
421: Sequential Circuit Testing, Test Compaction
-
428: 期中考
-
505: Memory Test, IDDQ Testing, 4-Way Bridge Test
-
512: DfR: Error Control Codes, EDC/ECC, Reliability Test, Confidence Test, BLER/BER/SNR Analyses
-
519: Mixed-Signal Test, Ring Oscillator, Signal Integrity Test
-
526: SoC Testing & FPGA Test
-
602: Low-Power Test
-
609: Delay Test
-
616: Practical Exam for Cell-based Scan Test
-
623: 期末考
- 課程介紹
- 課程安排
- 評論
